DIN 51003-2004《全反射X荧光分析 一般原理和概念》

This standard specifies definitions for analytical methods with which elements are identified and their
concentrations determined via measurements of X-ray emission or fluorescence.
The purpose of this standard is to establish definitions for TXRF and to match these with definitions relating
to the various areas of optical atomic spectral analysis: optical emission spectrometry (OES), atomic
absorption spectrometry (AAS) and atomic fluorescence spectrometry (AFS).